Symbol |
Description |
MKS Units |
A |
Area |
m2 |
c |
Speed of light in vacuum |
m/s |
C |
Capacitance per unit area |
F/m2 |
CFB |
Flatband capacitance per unit area of a MOS structure |
F/m2 |
Cj |
Junction capacitance per unit area |
F/m2 |
Cox |
Oxide capacitance per unit area |
F/m2 |
Dn |
Electron diffusion constant |
m2/s |
Dp |
Hole diffusion constant |
m2/s |
E |
Energy |
Joule |
E |
Electric field |
V/m |
Ea |
Acceptor energy |
Joule |
Ec |
Conduction band energy of a semiconductor |
Joule |
Ed |
Donor energy |
Joule |
EF |
Fermi energy (thermal equilibrium) |
Joule |
Eg |
Energy bandgap of a semiconductor |
Joule |
Ei |
Intrinsic Fermi energy |
Joule |
Ev |
Valence band energy of a semiconductor |
Joule |
Evacuum |
Electron energy in vacumm |
Joule |
f(E) |
Distribution function (probability density function) |
|
Fn |
Quasi-Fermi energy of electrons |
Joule |
Fp |
Quasi-Fermi energy of holes |
Joule |
gc(E) |
Density of states in the conduction band per unit energy and per unit volume |
m-3J-1 |
gv(E) |
Density of states in the valence band per unit energy and per unit volume |
m-3J-1 |
Gn |
Electron generation rate |
m-3s-1 |
Gp |
Hole generation rate |
m-3s-1 |
h |
Plank's constant |
Js |
|
Reduced Plank's (= h /2π) |
Js |
I |
Current |
A |
J |
Current density |
A/m2 |
Jn |
Electron current density |
A/m2 |
Jp |
Hole current density |
A/m2 |
k |
Boltzmann's constant |
J/K |
l |
Mean free path |
m |
L |
Length |
m |
Ln |
Electron diffusion length |
m |
Lp |
Hole diffusion length |
m |
m |
Mass |
kg |
m0 |
Free electron mass |
kg |
me* |
Effective mass of electrons |
kg |
mh* |
Effective mass of holes |
kg |
n |
Electron density |
m-3 |
ni |
Intrinsic carrier density |
m-3 |
n(E) |
Electron density per unit energy and per unit volume |
m-3J-1 |
n0 |
Electron density in thermal equilibrium |
m-3 |
ni |
Intrinsic carrier density |
m-3 |
N |
Doping density |
m-3< |
Na |
Acceptor doping density |
m-3 |
Na- |
Ionized acceptor density |
m-3 |
NB |
Base doping density |
m-3 |
Nc |
Effective density of states in the conduction band |
m-3 |
NC |
Collector doping density |
m-3 |
Nd |
Donor doping density |
m-3 |
Nd+ |
Ionized donor density |
m-3 |
NE |
Emitter doping density |
m-3 |
Nv |
Effective density of states in the valence band |
m-3 |
p |
Hole density |
m-3 |
p(E) |
Hole density per unit energy |
m-3J-1 |
p0 |
Hole density in thermal equilibrium |
m-3 |
pn |
Hole density in an n-type semiconductor |
m-3 |
q |
electronic charge |
C |
Q |
Charge |
C |
Qd |
Charge density per unit area in the depletion layer of an MOS structure |
C/m2 |
Qd,T |
Charge density per unit area at threshold in the depletion layer of an MOS structure |
C/m2 |
Qi |
Interface charge density per unit area |
C/m2 |
R |
Resistance |
Ohm |
Rn |
Electron recombination rate |
m-3s-1 |
Rp |
Hole recombination rate |
m-3s-1 |
t |
Thickness |
m |
tox |
Oxide thickness |
m |
T |
Temperature |
Kelvin |
Un |
Net recombination rate of electrons |
m-3s-1 |
Up |
Net recombination rate of holes |
m-3s-1 |
v |
Velocity |
m/s |
vth |
Thermal velocity |
m/s |
Va |
Applied voltage |
V |
VB |
Base voltage |
V |
VC |
Collector voltage |
V |
VD |
Drain voltage |
V |
VE |
Emitter voltage |
V |
VFB |
Flatband voltage |
V |
VG |
Gate voltage |
V |
Vt |
Thermal voltage |
V |
VT |
Threshold voltage of an MOS structure |
V |
w |
Depletion layer width |
m |
wB |
Base width |
m |
wC |
Collector width |
m |
wE |
Emitter width |
m |
wn |
Width of an n-type region |
m |
wp |
Width of a p-type region |
m |
x |
Position |
m |
xd |
Depletion layer width in an MOS structure |
m |
xd,T |
Depletion layer width in an MOS structure at threshold |
m |
xj |
Junction depth |
m |
xn |
Depletion layer width in an n-type semiconductor |
m |
xp |
Depletion layer width in a p-type semiconductor |
m |
α |
Transport factor |
|
β |
Current gain |
|
γ |
Body effect parameter |
V1/2 |
γE |
Emitter efficiency |
|
δ n |
Excess electron density |
m-3 |
<δ p |
Excess hole density |
m-3 |
ΔQn,B |
Excess electron charge density in the base |
C/m2 |
εox |
Dielectric constant of the oxide |
F/m |
es |
Dielectric constant of the semiconductor |
F/m |
μn |
Electron mobility |
m2/V-s |
μp |
Hole mobility |
m2/V-s |
ρ |
Charge density per unit volume Resistivity |
C/m3 Ωm |
ρox |
Charge density per unit volume in the oxide |
C/m3 |
σ |
Conductivity |
Ω-1m-1 |
τn |
Electron lifetime |
s |
τp |
Hole lifetime |
s |
φ |
Potential |
V |
φB |
Barrier height |
V |
φF |
Bulk potential |
V |
φi |
Built-in potential of a p-n diode or Schottky diode |
V |
φs |
Potential at the semiconductor surface |
V |
ΦM |
Workfunction of the metal |
V |
ΦMS |
Workfunction difference between the metal and the semiconductor |
V |
ΦS |
Workfunction of the semiconductor |
V |
Φ |
Electron affinity of the semiconductor |
V |