
|
Symbol |
Description |
MKS Units |
|
A |
Area |
m2 |
|
c |
Speed of light in vacuum |
m/s |
|
C |
Capacitance per unit area |
F/m2 |
|
CFB |
Flatband capacitance per unit area of a MOS structure |
F/m2 |
|
Cj |
Junction capacitance per unit area |
F/m2 |
|
Cox |
Oxide capacitance per unit area |
F/m2 |
|
Dn |
Electron diffusion constant |
m2/s |
|
Dp |
Hole diffusion constant |
m2/s |
|
E |
Energy |
Joule |
|
E |
Electric field |
V/m |
|
Ea |
Acceptor energy |
Joule |
|
Ec |
Conduction band energy of a semiconductor |
Joule |
|
Ed |
Donor energy |
Joule |
|
EF |
Fermi energy (thermal equilibrium) |
Joule |
|
Eg |
Energy bandgap of a semiconductor |
Joule |
|
Ei |
Intrinsic Fermi energy |
Joule |
|
Ev |
Valence band energy of a semiconductor |
Joule |
|
Evacuum |
Electron energy in vacumm |
Joule |
|
f(E) |
Distribution function (probability density function) |
|
|
Fn |
Quasi-Fermi energy of electrons |
Joule |
|
Fp |
Quasi-Fermi energy of holes |
Joule |
|
gc(E) |
Density of states in the conduction band per unit energy and per unit volume |
m-3J-1 |
|
gv(E) |
Density of states in the valence band per unit energy and per unit volume |
m-3J-1 |
|
Gn |
Electron generation rate |
m-3s-1 |
|
Gp |
Hole generation rate |
m-3s-1 |
|
h |
Plank's constant |
Js |
|
|
Reduced Plank's (= h /2π) |
Js |
|
I |
Current |
A |
|
J |
Current density |
A/m2 |
|
Jn |
Electron current density |
A/m2 |
|
Jp |
Hole current density |
A/m2 |
|
k |
Boltzmann's constant |
J/K |
|
l |
Mean free path |
m |
|
L |
Length |
m |
|
Ln |
Electron diffusion length |
m |
|
Lp |
Hole diffusion length |
m |
|
m |
Mass |
kg |
|
m0 |
Free electron mass |
kg |
|
me* |
Effective mass of electrons |
kg |
|
mh* |
Effective mass of holes |
kg |
|
n |
Electron density |
m-3 |
|
ni |
Intrinsic carrier density |
m-3 |
|
n(E) |
Electron density per unit energy and per unit volume |
m-3J-1 |
|
n0 |
Electron density in thermal equilibrium |
m-3 |
|
ni |
Intrinsic carrier density |
m-3 |
|
N |
Doping density |
m-3< |
|
Na |
Acceptor doping density |
m-3 |
|
Na- |
Ionized acceptor density |
m-3 |
|
NB |
Base doping density |
m-3 |
|
Nc |
Effective density of states in the conduction band |
m-3 |
|
NC |
Collector doping density |
m-3 |
|
Nd |
Donor doping density |
m-3 |
|
Nd+ |
Ionized donor density |
m-3 |
|
NE |
Emitter doping density |
m-3 |
|
Nv |
Effective density of states in the valence band |
m-3 |
|
p |
Hole density |
m-3 |
|
p(E) |
Hole density per unit energy |
m-3J-1 |
|
p0 |
Hole density in thermal equilibrium |
m-3 |
|
pn |
Hole density in an n-type semiconductor |
m-3 |
|
q |
electronic charge |
C |
|
Q |
Charge |
C |
|
Qd |
Charge density per unit area in the depletion layer of an MOS structure |
C/m2 |
|
Qd,T |
Charge density per unit area at threshold in the depletion layer of an MOS structure |
C/m2 |
|
Qi |
Interface charge density per unit area |
C/m2 |
|
R |
Resistance |
Ohm |
|
Rn |
Electron recombination rate |
m-3s-1 |
|
Rp |
Hole recombination rate |
m-3s-1 |
|
t |
Thickness |
m |
|
tox |
Oxide thickness |
m |
|
T |
Temperature |
Kelvin |
|
Un |
Net recombination rate of electrons |
m-3s-1 |
|
Up |
Net recombination rate of holes |
m-3s-1 |
|
v |
Velocity |
m/s |
|
vth |
Thermal velocity |
m/s |
|
Va |
Applied voltage |
V |
|
VB |
Base voltage |
V |
|
VC |
Collector voltage |
V |
|
VD |
Drain voltage |
V |
|
VE |
Emitter voltage |
V |
|
VFB |
Flatband voltage |
V |
|
VG |
Gate voltage |
V |
|
Vt |
Thermal voltage |
V |
|
VT |
Threshold voltage of an MOS structure |
V |
|
w |
Depletion layer width |
m |
|
wB |
Base width |
m |
|
wC |
Collector width |
m |
|
wE |
Emitter width |
m |
|
wn |
Width of an n-type region |
m |
|
wp |
Width of a p-type region |
m |
|
x |
Position |
m |
|
xd |
Depletion layer width in an MOS structure |
m |
|
xd,T |
Depletion layer width in an MOS structure at threshold |
m |
|
xj |
Junction depth |
m |
|
xn |
Depletion layer width in an n-type semiconductor |
m |
|
xp |
Depletion layer width in a p-type semiconductor |
m |
|
α |
Transport factor |
|
|
β |
Current gain |
|
|
γ |
Body effect parameter |
V1/2 |
|
γE |
Emitter efficiency |
|
|
δ n |
Excess electron density |
m-3 |
|
<δ p |
Excess hole density |
m-3 |
|
ΔQn,B |
Excess electron charge density in the base |
C/m2 |
|
εox |
Dielectric constant of the oxide |
F/m |
|
es |
Dielectric constant of the semiconductor |
F/m |
|
μn |
Electron mobility |
m2/V-s |
|
μp |
Hole mobility |
m2/V-s |
|
ρ |
Charge density per unit volume Resistivity |
C/m3 Ωm |
|
ρox |
Charge density per unit volume in the oxide |
C/m3 |
|
σ |
Conductivity |
Ω-1m-1 |
|
τn |
Electron lifetime |
s |
|
τp |
Hole lifetime |
s |
|
φ |
Potential |
V |
|
φB |
Barrier height |
V |
|
φF |
Bulk potential |
V |
|
φi |
Built-in potential of a p-n diode or Schottky diode |
V |
|
φs |
Potential at the semiconductor surface |
V |
|
ΦM |
Workfunction of the metal |
V |
|
ΦMS |
Workfunction difference between the metal and the semiconductor |
V |
|
ΦS |
Workfunction of the semiconductor |
V |
|
Φ |
Electron affinity of the semiconductor |
V |