| Chapter 6 |
Name | Description |
Accumulation of free carriers in a semiconductor | |
Back contact of a MOSFET also referred to as the substrate contact. | |
Capacitance versus voltage measurement | |
Characteristic length over which the carrier density in a semiconductor changes by a factor e | |
Energy band diagram of a MOS capacitor containing no net charge in the semiconductor | |
Change of carrier type in a semiconductor obtained by applying an external voltage. In a MOSFET, inversion creates the free carriers, which cause the drain current. | |
The layer of free carriers of opposite type at the semiconductor-oxide interface of a MOSFET |